Journal of Electronic Testing: Theory and Applications is a peer-reviewed scientific journal published bimonthly by Springer Science+Business Media. Established in 1990, it covers developments in electronics testing, including tests of VLSI devices and printed circuit boards, as well as fault modeling and analysis. Its current editor-in-chief is Vishwani Agrawal (Auburn University).
Abstracting and indexing The journal is abstracted and indexed in:
Current Contents/Electronics & Telecommunications Collection Current Contents/Engineering/Computing & Technology EBSCO databases Ei Compendex Inspec ProQuest databases Science Citation Index Expanded Scopus According to the Journal Citation Reports, the journal has a 2024 impact factor of 1.3.
References
External links Official website
