This is a list of analysis methods used in materials science. Analysis methods are listed by their acronym, if one exists.
Symbols μSR – see muon spin spectroscopy χ – see magnetic susceptibility
A AAS – Atomic absorption spectroscopy AED – Auger electron diffraction AES – Auger electron spectroscopy AFM – Atomic force microscopy AFS – Atomic fluorescence spectroscopy Analytical ultracentrifugation APFIM – Atom probe field ion microscopy APS – Appearance potential spectroscopy ARPES – Angle resolved photoemission spectroscopy ARUPS – Angle resolved ultraviolet photoemission spectroscopy ATR – Attenuated total reflectance
B BET – BET surface area measurement (BET from Brunauer, Emmett, Teller) BiFC – Bimolecular fluorescence complementation BKD – Backscatter Kikuchi diffraction, see EBSD BRET – Bioluminescence resonance energy transfer BSED – Back scattered electron diffraction, see EBSD
C CAICISS – Coaxial impact collision ion scattering spectroscopy CARS – Coherent anti-Stokes Raman spectroscopy CBED – Convergent beam electron diffraction CCM – Charge collection microscopy CDI – Coherent diffraction imaging CE – Capillary electrophoresis CET – Cryo-electron tomography CL – Cathodoluminescence CLSM – Confocal laser scanning microscopy COSY – Correlation spectroscopy Cryo-EM – Cryo-electron microscopy Cryo-SEM – Cryo-scanning electron microscopy CV – Cyclic voltammetry
D DE(T)A – Dielectric thermal analysis dHvA – De Haas–van Alphen effect DIC – Differential interference contrast microscopy Dielectric spectroscopy DLS – Dynamic light scattering DLTS – Deep-level transient spectroscopy DMA – Dynamic mechanical analysis DPI – Dual polarisation interferometry DRS – Diffuse reflection spectroscopy DSC – Differential scanning calorimetry DTA – Differential thermal analysis DVS – Dynamic vapour sorption
E EBIC – Electron beam induced current (see IBIC: ion beam induced charge) EBS – Elastic (non-Rutherford) backscattering spectrometry (see RBS) EBSD – Electron backscatter diffraction ECOSY – Exclusive correlation spectroscopy ECT – Electrical capacitance tomography EDAX – Energy-dispersive analysis of x-rays EDMR – Electrically detected magnetic resonance, see ESR or EPR EDS or EDX – Energy dispersive X-ray spectroscopy EELS – Electron energy loss spectroscopy EFTEM – Energy filtered transmission electron microscopy EID – Electron induced desorption EIT and ERT – Electrical impedance tomography and electrical resistivity tomography EL – Electroluminescence Electron crystallography ELS – Electrophoretic light scattering ENDOR – Electron nuclear double resonance, see ESR or EPR EPMA – Electron probe microanalysis EPR – Electron paramagnetic resonance spectroscopy ERD or ERDA – Elastic recoil detection or elastic recoil detection analysis ESCA – Electron spectroscopy for chemical analysis see XPS ESD – Electron stimulated desorption ESEM – Environmental scanning electron microscopy ESI-MS or ES-MS – Electrospray ionization mass spectrometry or electrospray mass spectrometry ESR – Electron spin resonance spectroscopy ESTM – Electrochemical scanning tunneling microscopy EXAFS – Extended X-ray absorption fine structure EXSY – Exchange spectroscopy
F FCS – Fluorescence correlation spectroscopy FCCS – Fluorescence cross-correlation spectroscopy FEM – Field emission microscopy FIB – Focused ion beam microscopy FIM-AP – Field ion microscopy–atom probe Flow birefringence Fluorescence anisotropy FLIM – Fluorescence lifetime imaging Fluorescence microscopy FOSPM – Feature-oriented scanning probe microscopy FRET – Fluorescence resonance energy transfer FRS – Forward Recoil Spectrometry, a synonym of ERD FTICR or FT-MS – Fourier-transform ion cyclotron resonance or Fourier-transform mass spectrometry FTIR – Fourier-transform infrared spectroscopy
G GC-MS – Gas chromatography-mass spectrometry GDMS – Glow discharge mass spectrometry GDOS – Glow discharge optical spectroscopy GISAXS – Grazing incidence small angle X-ray scattering GIXD – Grazing incidence X-ray diffraction GIXR – Grazing incidence X-ray reflectivity GLC – Gas-liquid chromatography GPC – Gel permeation chromatography
H HAADF – High angle annular dark-field imaging HAS – Helium atom scattering HPLC – High performance liquid chromatography HREELS – High resolution electron energy loss spectroscopy HREM – High-resolution electron microscopy HRTEM – High-resolution transmission electron microscopy HI-ERDA – Heavy-ion elastic recoil detection analysis HE-PIXE – High-energy proton induced X-ray emission
I IAES – Ion induced Auger electron spectroscopy IBA – Ion beam analysis IBIC – Ion beam induced charge microscopy ICP-AES – Inductively coupled plasma atomic emission spectroscopy ICP-MS – Inductively coupled plasma mass spectrometry Immunofluorescence ICR – Ion cyclotron resonance IETS – Inelastic electron tunneling spectroscopy IGA – Intelligent gravimetric analysis IGF – Inert gas fusion IIX – Ion induced X-ray analysis, see particle induced X-ray emission INS – Ion neutralization spectroscopy Inelastic neutron scattering IRNDT – Infrared non-destructive testing of materials IRS – Infrared spectroscopy ISS – Ion scattering spectroscopy ITC – Isothermal titration calorimetry IVEM – Intermediate voltage electron microscopy
L LALLS – Low-angle laser light scattering LC-MS – Liquid chromatography-mass spectrometry LEED – Low-energy electron diffraction LEEM – Low-energy electron microscopy LEIS – Low-energy ion scattering LIBS – Laser induced breakdown spectroscopy LOES – Laser optical emission spectroscopy LS – Light (Raman) scattering
M MALDI – Matrix-assisted laser desorption/ionization MBE – Molecular beam epitaxy MEIS – Medium energy ion scattering MFM – Magnetic force microscopy MIT – Magnetic induction tomography MPM – Multiphoton fluorescence microscopy MRFM – Magnetic resonance force microscopy MRI – Magnetic resonance imaging MS – Mass spectrometry MS/MS – Tandem mass spectrometry MSGE – Mechanically stimulated gas emission Mössbauer spectroscopy MTA – Microthermal analysis
N NAA – Neutron activation analysis ND – Neutron diffraction NDP – Neutron depth profiling NEXAFS – Near edge X-ray absorption fine structure NIS – Nuclear inelastic scattering/absorption NMR – Nuclear magnetic resonance spectroscopy NOESY – Nuclear Overhauser effect spectroscopy NRA – Nuclear reaction analysis NSOM – Near-field optical microscopy
O OBIC – Optical beam induced current ODNMR – Optically detected magnetic resonance, see ESR or EPR OES – Optical emission spectroscopy Osmometry
P PAS – Positron annihilation spectroscopy Photoacoustic spectroscopy PAT or PACT – Photoacoustic tomography or photoacoustic computed tomography PAX – Photoemission of adsorbed xenon PC or PCS – Photocurrent spectroscopy Phase contrast microscopy PhD – Photoelectron diffraction PD – Photodesorption PDEIS – Potentiodynamic electrochemical impedance spectroscopy PDS – Photothermal deflection spectroscopy PED – Photoelectron diffraction PEELS – parallel electron energy loss spectroscopy PEEM – Photoemission electron microscopy (or photoelectron emission microscopy) PES – Photoelectron spectroscopy PINEM – photon-induced near-field electron microscopy PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis PIXE – Particle (or proton) induced X-ray spectroscopy PL – Photoluminescence Porosimetry Powder diffraction PTMS – Photothermal microspectroscopy PTS – Photothermal spectroscopy
Q QENS – Quasielastic neutron scattering QCM-D – Quartz crystal microbalance with dissipation monitoring
R Raman spectroscopy RAXRS – Resonant anomalous X-ray scattering RBS – Rutherford backscattering spectrometry REM – Reflection electron microscopy RDS – Reflectance difference spectroscopy RHEED – Reflection high energy electron diffraction RIMS – Resonance ionization mass spectrometry RIXS – Resonant inelastic X-ray scattering RR spectroscopy – Resonance Raman spectroscopy
S SAD – Selected area diffraction SAED – Selected area electron diffraction SAM – Scanning Auger microscopy SANS – Small angle neutron scattering SAXS – Small angle X-ray scattering SCANIIR – Surface composition by analysis of neutral species and ion-impact radiation SCEM – Scanning confocal electron microscopy SE – Spectroscopic ellipsometry SEC – Size exclusion chromatography SEIRA – Surface enhanced infrared absorption spectroscopy SEM – Scanning electron microscopy SERS – Surface enhanced Raman spectroscopy SERRS – Surface enhanced resonance Raman spectroscopy SESANS – Spin Echo Small Angle Neutron Scattering SEXAFS – Surface extended X-ray absorption fine structure SICM – Scanning ion-conductance microscopy SIL – Solid immersion lens SIM – Solid immersion mirror SIMS – Secondary ion mass spectrometry SNMS – Sputtered neutral species mass spectrometry SNOM – Scanning near-field optical microscopy SPECT – Single-photon emission computed tomography SPM – Scanning probe microscopy SRM-CE/MS – Selected-reaction-monitoring capillary-electrophoresis mass-spectrometry SSNMR – Solid-state nuclear magnetic resonance Stark spectroscopy STED – Stimulated emission depletion microscopy STEM – Scanning transmission electron microscopy STM – Scanning tunneling microscopy STS – Scanning tunneling spectroscopy SXRD – Surface X-ray diffraction
T TAT or TACT – Thermoacoustic tomography or thermoacoustic computed tomography (see also photoacoustic tomography – PAT) TEM – Transmission electron microscopy TGA – Thermogravimetric analysis TIKA – Transmitting ion kinetic analysis TIMS – Thermal ionization mass spectrometry TIRFM – Total internal reflection fluorescence microscopy TLS – Photothermal lens spectroscopy, a type of photothermal spectroscopy TMA – Thermomechanical analysis TOF-MS – Time-of-flight mass spectrometry Two-photon excitation microscopy TXRF – Total reflection X-ray fluorescence analysis
U Ultrasound attenuation spectroscopy UPS – UV-photoelectron spectroscopy USANS – Ultra small-angle neutron scattering USAXS – Ultra small-angle X-ray scattering UT – Ultrasonic testing UV-Vis – Ultraviolet–visible spectroscopy
V VEDIC – Video-enhanced differential interference contrast microscopy Voltammetry
W WAXS – Wide angle X-ray scattering WDX or WDS – Wavelength dispersive X-ray spectroscopy
X XAES – X-ray induced Auger electron spectroscopy XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure) XAS – X-ray absorption spectroscopy X-CTR – X-ray crystal truncation rod scattering X-ray crystallography XDS – X-ray diffuse scattering XES – X-ray emission spectroscopy XPEEM – X-ray photoelectron emission microscopy XPS – X-ray photoelectron spectroscopy XRD – X-ray diffraction XRES – X-ray resonant exchange scattering XRF – X-ray fluorescence analysis XRR – X-ray reflectivity XRS – X-ray Raman scattering XRT – X-ray transmission XSW – X-ray standing wave technique
See also Characterization (materials science)
References Callister, WD (2000). Materials Science and Engineering – An Introduction. London: John Wiley and Sons. ISBN 0-471-32013-7. Yao, N, ed. (2007). Focused Ion Beam Systems: Basics and Applications. Cambridge, UK: Cambridge University Press. ISBN 978-0-521-83199-4.