Multi-tip scanning tunneling microscopy (Multi-tip STM) extends scanning tunneling microscopy (STM) from imaging to dedicated electrical measurements at the nanoscale like a ″multimeter at the nanoscale″. In materials science, nanoscience, and nanotechnology, it is desirable to measure electrical properties at a particular position of the sample. For this purpose, multi-tip STMs in which several tips are operated independently have been developed. Apart from imaging the sample, the tips of a multi-tip STM are used to form contacts to the sample at desired locations and to perform local electrical measurements.
Introduction As microelectronics evolves into nanoelectronics, it is essential to perform electronic transport measurements at nanoscale. The standard approach is to use lithographic methods to contact nanostructures, as it is also used in the final nanoelectronic device. In research and development stages, however, other methods to contact nanoelectronic devices or generally nanostructures may be more suitable. An alternative approach for contacting nanostructures uses the tips of a multi-tip scanning tunneling microscope—in analogy to the test leads of a multimeter used at macroscale. The advantages of this approach are: (a) in situ contacting of ″as grown″ nanostructures still under vacuum helps keep delicate nanostructures free from contamination induced by lithography steps performed for contacting. (b) Flexible positioning of the contacting tips and different contact configurations are easy to realize, while lithographic contacts are fixed. (c) Probing with sharp tips can be non-invasive (high ohmic), while lithographic contacts are typically invasive (low ohmic). To use a scanning tunneling microscope (STM) for electrical transport measurements at nanostructures or at surfaces, more than one tip is required. This motivates the use of multi-tip scanning tunneling microscopes which give access to the above outlined advantages in nanoprobing. Several review articles about multi-tip STM can be found in the further reading section below.
Principle of operation Multi-tip scanning tunneling microscopes consist usually of four STM units positioning each of the tips individually to the desired position on the sample. To reduce thermal drift of the tips, the four STM units, should be as small and compact as possible. It is important that the motion of the tips can be observed, either by an optical microscope, or by a scanning electron microscope (SEM). This allows to bring the tips close together and to position them at the desired measurement locations. The tips in a multi tip STM are usually mounted under 45° relative to the vertical direction to facilitate positioning all tips at one region on the sample. After the first multi-tip STM was introduced, several home-built instruments were designed and today, several commercial instruments are available as well. An extension of the multi-tip STM technique is the upgrade to atomic force microscopy (AFM) operation. For applications in nanoelectronics, most of the samples consist of conducting "target" areas at the surface, separated by non-conducting areas. To guide the tip to the conducting areas, AFM imaging instead of or in addition to optical microscope or SEM guided positioning of the tips, can be very useful.
When performing electrical measurements on the nanoscale, it should be stressed that the contact resistance is often very large at the STM tip contact to the sample because the contact area is very small, so that four-point measurements are indispensable in resistance measurements with a muti-tip STM. This is even more important in measuring nano-scale objects, because the contacts to these objects are inevitably nano-scale. In a two-point resistance measurement, the two current injecting tips are used for voltage probing as well. Therefore, the measured resistance R = V/I also includes the contribution from the two contact resistances RC. In a four-point measurement the current injecting circuit is separated from the voltage sensing circuit. If the voltage measurement is performed with a large internal resistance RV, the influence of the contact resistances can be neglected. This is the main advantage of the four-point measurement.
Performing electrical measurements with a multi-tip STM demands more than four tips and the ability to position them as required. Concerted measurements of currents and voltages with all four tips must be performed. The electronics allows operating each tip either as (biased) current probe, or as voltage probe. Different I-V ramps are applied between different tips (and/or the sample). In the simplest case a current is injected between the two outer tips and a potential difference is measured between the inner tips (classical four-point measurement), also as a function of temperature. However, also various kinds of other measurements can be performed, e.g., a tip or the sample can be used as gate electrode.
Applications of multi-tip STM
Graphene nanoribbons and graphene nanostructures The local transport properties of 40 nm wide graphene nanoribbons grown on silicon carbide (SiC) substrates, are studied by means of a multi-tip STM. The graphene nanoribbons exhibit exceptional transport properties, such as ballistic conduction even at room temperature with mean free paths up to several μm. Such epitaxial graphene nanoribbons are important not only in fundamental science, but also because they can be readily produced in thousands in advanced nanoelectronics, which can make use of their room-temperature ballistic transport properties.
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