Nano angle-resolved photoemission spectroscopy (Nano-ARPES) is a variant of the experimental technique angle-resolved photoemission spectroscopy (ARPES). It has the ability to precisely determine the electronic band structure of materials in momentum space with submicron lateral resolution. Due to its demanding experimental setup, this technique is much less extended than ARPES, widely used in condensed matter physics to experimentally determine the electronic properties of a broad range of crystalline materials. Nano-ARPES can access the electronic structure of well-ordered monocrystalline solids with high energy, momentum, and lateral resolution, even if they are nanometric or heterogeneous mesoscopic samples. Nano-ARPES technique is also based on Einstein's photoelectric effect, being photon-in electron-out spectroscopy, which has converted into an essential tool in studying the electronic structure of nanomaterials, like quantum and low dimensional materials. NanoARPES allows to determine experimentally the relationship between the binding energies and wave momenta of the electrons of the occupied electronic states of the bands with energies close and approximately 10-15 eV below the Fermi level. These electrons are ejected from a solid when it is illuminated by monochromatic photons with sufficient energy to emit photoelectrons from the surface of the material. These photoelectrons are detected by an electron analyzer placed close to the samples surface in vacuum to preserve the uncontaminated surfaces and to avoid the collisions with particles able to modify the energy and trajectory of the photoelectrons in their way to the spectrometer. As in the photoemission process, the momentum is conserved; therefore, the angular distribution of photoelectrons from a monocrystal, even if it is a nanometric size, is also enabled to directly reveal the momentum distribution of initial electronic states in that crystal. The Nano-ARPES results, as in the ARPES technique, are traditionally shown as energy-momentum dispersion relation along the high symmetry directions of the irreducible Brillouin Zone, displaying the band dispersions of the investigated materials. When the emitted photoelectrons are shown by constant energy surfaces throughout large portions of the reciprocal space, Nano-ARPES can also precisely determine the Fermi surface of the investigated materials. Due to the unique ability to spatially map the electronic dispersion of the electrons in the samples, Nano-ARPES can also generate electronic imaging of nanomaterials with high binding energy and momentum resolution. As Nano-ARPES is a scanning technique, it can use state-of-the-art ARPES spectrometers without requiring them to be able also to discriminate spatially the origin of the analysed photoelectrons. Consequently, Nano-ARPES instrumentation can profit from the most advanced spectrometers developed for ARPES setups, particularly those of the latest generation electron spectrometers with bidimensional detection and high energy and momentum resolution.
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