Selected-ion flow-tube mass spectrometry (SIFT-MS) is a quantitative mass spectrometry technique for trace gas analysis which involves the chemical ionization of trace volatile compounds by selected positive precursor ions during a well-defined time period along a flow tube. Absolute concentrations of trace compounds present in air, breath or the headspace of bottled liquid samples can be calculated in real time from the ratio of the precursor and product ion signal ratios, without the need for sample preparation or calibration with standard mixtures. The detection limit of commercially available SIFT-MS instruments extends to the single digit pptv range. The instrument is an extension of the selected ion flow tube, SIFT, technique, which was first described in 1976 by Adams and Smith. It is a fast flow tube/ion swarm method to react positive or negative ions with atoms and molecules under truly thermalised conditions over a wide range of temperatures. It has been used extensively to study ion-molecule reaction kinetics. Its application to ionospheric and interstellar ion chemistry over a 20-year period has been crucial to the advancement and understanding of these topics. SIFT-MS was initially developed for use in human breath analysis, and has shown great promise as a non-invasive tool for physiological monitoring and disease diagnosis. It has since shown potential for use across a wide variety of fields, particularly in the life sciences, such as agriculture and animal husbandry, environmental research and food technology. Two main commercial implementations of this technology exist: • Syft Technologies Christchurch, New Zealand) offers SIFT-MS instruments (e.g., Voice series), which are the most widely recognized and have popularized the technique for real-time trace gas analysis. • Young In Ace (South Korea) provides the ACE 1100 IMR-MS (Ion Molecule Reaction Mass Spectrometer), developed based on SIFT technology for real-time qualitative and quantitative analysis of volatile organic compounds (VOCs). These instruments enable direct, chromatography-free analysis with soft chemical ionization using reagent ions such as H₃O⁺, NO⁺, and O₂⁺. The SIFT technique, which is the basis of SIFT-MS, was conceived and developed in the 1970s at the University of Birmingham, England, by Nigel Adams and David Smith.
Instrumentation In the selected ion flow tube mass spectrometer, SIFT-MS, ions are generated in a microwave plasma ion source, usually from a mixture of laboratory air and water vapor. From the formed plasma, a single ionic species is selected using a quadrupole mass filter to act as "precursor ions" (also frequently referred to as primary or reagent ions in SIFT-MS and other processes involving chemical ionization). In SIFT-MS analyses, H3O+, NO+ and O2+ are used as precursor ions, and these have been chosen because they are known not to react significantly with the major components of air (nitrogen, oxygen, etc.), but can react with many of the very low level (trace) gases. The selected precursor ions are injected into a flowing carrier gas (usually helium at a pressure of 1 Torr) via a Venturi orifice (~1 mm diameter) where they travel along the reaction flow tube by convection. Concurrently, the neutral analyte molecules of a sample vapor enter the flow tube, via a heated sampling tube, where they meet the precursor ions and may undergo chemical ionization, depending on their chemical properties, such as their proton affinity or ionization energy. The newly formed "product ions" flow into the mass spectrometer chamber, which contains a second quadrupole mass filter, and an electron multiplier detector, which are used to separate the ions by their mass-to-charge ratios (m/z) and measure the count rates of the ions in the desired m/z range.
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